Atomic and molecular spectroscopy
o
Measurement
of the transition probabilities for 5 very weak UV lines of Ar I emitted from a
glaring jet of argon plasma in pseudo-equilibrium
o
Measurement
of the relative transition probabilities for 27 spectral lines of silicon atom
Si I (in ultraviolet) and for 5 spectral lines of the silicon first ion Si
II (in visible) in an Ar + SiCl4 plasma jet
o
Experimental
determination of more than 150 transition probabilities for Ti I, Ti II, and Ti
III lines in UV and in visible parts of the spectrum
o
Measurement
of transition probabilities for violet lines of Ne I
o
Study
of Si II line broadening in an arc plasma
o
He I
line profiles emitted in a helium-hydrogen plasma jet or in an electric arc
o
Experimental
study of the resonance Li I line shift and broadening in an arc plasma striking
a cathode filled with CaCl2 + LiCl molten salt
o
Detailed
study of the Ar I 430 nm line profile
o
Study
of the profiles of certain atomic and ionic sulfur (S I and S II) and fluorine
(F I) spectral lines
o
Stark
broadening and shift of atomic spectral lines of Ar II
o
Contribution
of the Excited States to the Refraction Index of an Ar Plasma
o
Observation
of new bands in the TiO molecular spectrum
o
Absolute
values of transition probabilities for (0,0) and (1,1) bands of c1F- a1D system of the TiO molecule
o
N2,
N2+, CN, C2, CH, and OH molecular spectra
computer simulation (and experimental validation) under different spectral
resolutions and temperatures (2.0-7.5 kK)
o
Experimental
transition probability for (0,1) and (0,2) bands for A1F - X1S+ system of SiO molecule